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ECE 5480: VLSI Testing and Verification

3 Credits
Theory and practice of testing and verification of VLSI systems. Topics include fault modeling, fault simulation, test generation, scan design and design for testability (DFT). Students develop experience with commercial testing and DFT tools.

Prerequisite/Restriction: ECE 2700 and professional program or graduate standing

Semester(s) Traditionally Offered: SPRING

Topics Covered: Introduction, test process and test equipment; Test Economics; Logic Modeling, Fault Modeling; Logic and Fault Simulation; Combinational test generation basics; ATPG Algorithms: D-Algorithm, PODEM,FAN; Testability Measure, ATPG systems; Sequential Circuits ATPG; Functional Testing: Checking Experiments

Course Instructor: Sanghamitra Roy

Textbook: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits